Projects
Case studies focused on manufacturing quality data, SSD yield investigation, SMT process control, and automation workflows.
6 projects · 2 featured
Featured
M.2 SSD DAS FET Burnout Root Cause Analysis and LI Process ImprovementTraced intermittent M.2 SSD DAS FET burnout to conductive debris, PCB/socket alignment risk, and LI DAS screening limitations, then helped reduce the collected/confirmed FET burnout rate from 11 ppm to 2 ppm.View case studyFeatured
Manufacturing Quality Anomaly Detection DashboardSynthetic manufacturing quality dashboard for yield movement, defect-code concentration, equipment-level failure patterns, false-fail signals, anomaly ranking, and corrective-action validation.View case studyUFS V5 IT: Reducing Repeated NGBin 19/109 Yield Excursions Through Wafer-Edge Pattern AnalysisAnalyzed repeated UFS V5 IT NGBin 19/109 yield excursions across multi-month production data, identified wafer-edge concentration patterns, and supported fab-side process changes that reduced defects by 3,007 ppm with an estimated monthly cost saving of about ¥3.48M.View case studyB-Series SSD: LI 4523 Failure Analysis from Controller ESD Damage to Router Grounding FailureTraced a 4,591 ppm LI 4523 failure spike from controller ESD damage to a Router grounding failure, then supported corrective action by identifying the damaged spindle carbon contact path.View case studyA-Series 22×80 LTS SSD: LI 4523 Failure Analysis from MLCC Damage to SMT Calibration DriftTraced 14 late-stage SSD test failures from LI 4523 (LINK PM FAIL) symptoms to MLCC (multilayer ceramic capacitor) damage caused by SMT underfill calibration drift, then proposed and coordinated a laser/nozzle height-difference monitoring requirement to help restore the defect rate to normal.View case studyManufacturing Quality Tableau DashboardSynthetic-data Tableau dashboard for yield trend, defect Pareto, equipment concentration, retest behavior, and corrective-action validation.View case study